Dr. W. Alan Doolittle

 

Contact Information:

Phone and Fax: 404-894-9884

Email: alan.doolittle@ece.gatech.edu

Mail:

School of Electrical and Computer Engineering

Georgia Institute of Technology

777 Atlantic Dr.

Atlanta, GA 30332-0250

 

Advanced Semiconductor Technology Facility

 

Home

GaN MBE Epitaxy

Li-Oxide MBE Epitaxy

Photo-assisted MOMBE

AlGaInAsSb MBE

SiC CVD (future)

Characterization Tools

Fabrication Tools

Funding and Projects

Mission:

      The Advanced Semiconductor Technology Facility is dedicated to the advancement of semiconductor technology with the primary mission of “thinking out of the box”.  The facility’s main goal is to identify and eliminate current semiconductor limitations by combinations of established successful technology and novel, non-standard approaches.  To this end, both traditional and non-traditional tools are used in the facility.

 

Major Tools Include:

 Traditional:

 Riber 32 MBE system utilizing Plasma and Ammonia sources for the growth of AlN, GaN and InN semiconductor alloys and devices.

 Varian Gen II with Antimony and Arsenic cracker sources for AlGaIn(AsSb) semiconductor alloys and devices

 Full complement of characterization facilities

Novel Technologies

 Photo-assisted Metal Organic MBE for mixed AlGaInN and SiC materials and devices

 Chloride based Li-Metal-Oxide MBE system for Li(Nb,Ta and V ) Oxide epitaxy

 High Temperature (1900° C) SiC CVD epitaxy system.